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Stoichiometry and Thickness of Epitaxial SrTiO₃ on Silicon (001): An Investigation of Physical, Optical, and Electrical Properties
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Stoichiometry and Thickness of Epitaxial SrTiO₃ on Silicon (001): An Investigation of Physical, Optical, and Electrical Properties
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Date
2025-JUL 22
Journal article
https://doi.org/10.1021/acs.cgd.5c00103
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Boelen, Andries
;
Baryshnikova, Marina
;
Ulrich, Anja
;
Brahim, Kamal
;
Van de Vondel, Joris
;
Haffner, Christian
;
Merckling, Clement
Journal
CRYSTAL GROWTH & DESIGN
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42
since deposited on 2025-08-01
8
last month
6
last week
Acq. date: 2026-01-10
Citations
Metrics
Views
42
since deposited on 2025-08-01
8
last month
6
last week
Acq. date: 2026-01-10
Citations