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Understanding the Role of Shape Imperfections on the Bit Error Rates of STT-MRAM Under External Magnetic Fields
Publication:
Understanding the Role of Shape Imperfections on the Bit Error Rates of STT-MRAM Under External Magnetic Fields
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Date
2025-JUL 25
Journal article
https://doi.org/10.1109/TED.2025.3589985
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ahirwar, Sonalie
;
Kumar, Ankit
;
Van Beek, Simon
;
Arya, Susheel Kumar
;
Linten, Dimitri
;
Wostyn, Kurt
;
Kar, Gouri Sankar
;
Pramanik, Tanmoy
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
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39
since deposited on 2025-08-03
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last month
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Acq. date: 2026-01-10
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Metrics
Views
39
since deposited on 2025-08-03
7
last month
4
last week
Acq. date: 2026-01-10
Citations