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Articles
C-SMART: A preprocessor for neural network performance and reliability under radiation
Publication:
C-SMART: A preprocessor for neural network performance and reliability under radiation
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Date
2025-OCT
Journal article
https://doi.org/10.1016/j.microrel.2025.115859
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rajappa, Anuj Justus
;
Reiter, Philippe
;
Rech, Paolo
;
Mercelis, Siegfried
;
Famaey, Jeroen
Journal
MICROELECTRONICS RELIABILITY
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Acq. date: 2026-01-10
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Metrics
Views
35
since deposited on 2025-08-03
3
last month
1
last week
Acq. date: 2026-01-10
Citations