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Articles
Physics-informed deep learning approach for nanoindentation-based thin film analysis
Publication:
Physics-informed deep learning approach for nanoindentation-based thin film analysis
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Date
2025-OCT
Journal article
https://doi.org/10.1016/j.microrel.2025.115875
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ozdemir, Yusuf Burak
;
Okudur, Oguzhan Orkut
;
Gonzalez, Mario
;
Merckling, Clement
Journal
MICROELECTRONICS RELIABILITY
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15
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15
since deposited on 2025-08-25
4
last month
Acq. date: 2026-01-10
Citations