Publication:
Extraction of the silicon film thickness on fully depleted SOI nMOSFETs using the black gate influence
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1960 since deposited on 2021-10-14
1last month
Acq. date: 2026-01-09
Citations
Metrics
Views
1960 since deposited on 2021-10-14
1last month
Acq. date: 2026-01-09
Citations