Publication:
A new method to extract the silicon film thickness of enhancement mode fully depleted SOI nMOSFETs at 300K
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2022 since deposited on 2021-10-14
1last month
Acq. date: 2026-05-20
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Statistics
Views
2022 since deposited on 2021-10-14
1last month
Acq. date: 2026-05-20
Citations