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Simulation of boron diffusion in strained Si1-xGex epitaxial layers
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Authors
Krishnasamy, Rajendran
;
Schoenmaker, Wim
;
Decoutere, Stefaan
;
Caymax, Matty
Conference
Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices - SISPAD
Title
Simulation of boron diffusion in strained Si1-xGex epitaxial layers
Publication type
Proceedings paper
Embargo date
9999-12-31
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