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Measuring mixed signal substrate coupling

dc.contributor.authorRolain, Yves
dc.contributor.authorVan Moer, W.
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorVan Heijningen, Marc
dc.date.accessioned2021-10-14T13:40:34Z
dc.date.available2021-10-14T13:40:34Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4704
dc.sourceIIOimport
dc.titleMeasuring mixed signal substrate coupling
dc.typeProceedings paper
dc.contributor.imecauthorVandersteen, Gerd
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage855
dc.source.endpage859
dc.source.conferenceProceedings of the 17th IEEE Instrumentation ad Measurement Technology Conference
dc.source.conferencedate1/05/2000
dc.source.conferencelocationBaltimore, MD USA
imec.availabilityPublished - open access


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