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Displacement damage effects after high energy proton irradiation in cryogenic MOSFETs for space applications

dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorMohammadzadeh, A.
dc.date.accessioned2021-10-14T13:46:54Z
dc.date.available2021-10-14T13:46:54Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4746
dc.sourceIIOimport
dc.titleDisplacement damage effects after high energy proton irradiation in cryogenic MOSFETs for space applications
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage47
dc.source.endpage53
dc.source.conferenceProceedings of the RADECS Workshop - Les Actes des Journees Techniques du RADECS
dc.source.conferencedate11/09/2000
dc.source.conferencelocationLouvain-la-Neuve Belgium
imec.availabilityPublished - open access


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