dc.contributor.author | Meuris, Marc | |
dc.contributor.author | Mertens, Paul | |
dc.contributor.author | Schmidt, Harald | |
dc.contributor.author | Hurd, Trace | |
dc.contributor.author | Li, Li | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Jonckx, Franky | |
dc.contributor.author | Maex, Karen | |
dc.contributor.author | Schild, R. | |
dc.contributor.author | Locke, K. | |
dc.contributor.author | Kozak, M. | |
dc.date.accessioned | 2021-09-29T12:54:44Z | |
dc.date.available | 2021-09-29T12:54:44Z | |
dc.date.issued | 1994 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/483 | |
dc.source | IIOimport | |
dc.title | New drying techology for advanced cleaning in IC manufacturing | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | Mertens, Paul | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Maex, Karen | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | Vacuum and Semiconductor Processing Conference | |
dc.source.conferencedate | 15/06/1994 | |
dc.source.conferencelocation | München Germany | |
imec.availability | Published - open access | |