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dc.contributor.authorMeuris, Marc
dc.contributor.authorMertens, Paul
dc.contributor.authorSchmidt, Harald
dc.contributor.authorHurd, Trace
dc.contributor.authorLi, Li
dc.contributor.authorHeyns, Marc
dc.contributor.authorJonckx, Franky
dc.contributor.authorMaex, Karen
dc.contributor.authorSchild, R.
dc.contributor.authorLocke, K.
dc.contributor.authorKozak, M.
dc.date.accessioned2021-09-29T12:54:44Z
dc.date.available2021-09-29T12:54:44Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/483
dc.sourceIIOimport
dc.titleNew drying techology for advanced cleaning in IC manufacturing
dc.typeProceedings paper
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorMertens, Paul
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorMaex, Karen
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceVacuum and Semiconductor Processing Conference
dc.source.conferencedate15/06/1994
dc.source.conferencelocationMünchen Germany
imec.availabilityPublished - open access


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