Browsing Articles by imec author "274ed1e002c0f7874d630338f511a061fb1bb6ba"
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Effect of the switching layer on CBRAM reliability and benchmarking against OxRAM devices
Reale, G.; Belmonte, Attilio; Fantini, Andrea; Radhakrishnan, Janaki; Redolfi, Augusto; Devulder, Wouter; Nyns, Laura; Kundu, Shreya; Delhougne, Romain; Goux, Ludovic; Kar, Gouri Sankar (2021) -
Impact of La-OH bonds on the retention of Co/LaSiO CBRAM
Radhakrishnan, Janaki; Belmonte, Attilio; Nyns, Laura; Devulder, Wouter; Vereecke, Guy; Donadio, Gabriele Luca; Kumbhare, P; Delhougne, Romain; Houssa, Michel; Kar, Gouri Sankar; Goux, Ludovic (2020) -
Impact of tungsten oxidation conditions on the performance of Al2O3/WOx-based CBRAM devices
Chen, Zhe; Belmonte, Attilio; Chen, Michael; Radhakrishnan, Janaki; Redolfi, Augusto; Kang, J.; Goux, Ludovic; Kar, Gouri Sankar (2017) -
Impacts of Ta buffer layer and Cu-Ge-Te composition on the reliability of GeSe-based CBRAM
Radhakrishnan, Janaki; Belmonte, Attilio; Devulder, Wouter; Redolfi, Augusto; Houssa, Michel; Kar, Gouri Sankar; Goux, Ludovic (2019) -
Improving post-cycling low resistance state retention in resistive RAM with combined oxygen vacancy and copper filament
Radhakrishnan, Janaki; Belmonte, Attilio; Clima, Sergiu; Redolfi, Augusto; Houssa, Michel; Kar, Gouri Sankar; Goux, Ludovic (2019) -
Key material parameters driving CBRAM device performance
Goux, Ludovic; Radhakrishnan, Janaki; Belmonte, Attilio; Witters, Thomas; Devulder, Wouter; Redolfi, Augusto; Houssa, Michel; Kar, Gouri Sankar (2019) -
Voltage-controlled reverse filament growth boosts resistive switching memory
Belmonte, Attilio; Celano, Umberto; Radhakrishnan, Janaki; Chen, Zhe; Redolfi, Augusto; Clima, Sergiu; Richard, Olivier; Bender, Hugo; Kar, Gouri Sankar; Vandervorst, Wilfried; Goux, Ludovic (2018)