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Effect of the switching layer on CBRAM reliability and benchmarking against OxRAM devices
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Authors
Reale, G.
;
Belmonte, Attilio
;
Fantini, Andrea
;
Radhakrishnan, Janaki
;
Redolfi, Augusto
;
Devulder, Wouter
;
Nyns, Laura
;
Kundu, Shreya
;
Delhougne, Romain
;
Goux, Ludovic
;
Kar, Gouri Sankar
DOI
10.1016/j.sse.2021.108058
ISSN
0038-1101
Issue
na
Journal
SOLID-STATE ELECTRONICS
Volume
184
Title
Effect of the switching layer on CBRAM reliability and benchmarking against OxRAM devices
Publication type
Journal article
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2
20.500.12860/37624.2
*
2021-12-06T10:59:40Z
validation by library/open access desk
1
20.500.12860/37624
2021-11-02T15:57:38Z
*Selected version
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