Browsing by author "Belmonte, Attilio"
Now showing items 1-20 of 82
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300mm IGZO nFETs with low-T Ru contacts for localized doping and increased BEOL compatibility
Kljucar, Luka; Smets, Quentin; van Setten, Michiel; Mitard, Jerome; Belmonte, Attilio; Dekkers, Harold; Teugels, Lieve; Mao, Ming; Puliyalil, Harinarayanan; del Agua Borniquel, Jose Ignacio; Delhougne, Romain; Sankaran, Kiroubanand; Tokei, Zsolt (2020) -
90nm W\Al2O3\TiW\Cu 1T1R CBRAM cell showing low-power, fast and disturb-free operation
Belmonte, Attilio; Kim, Woosik; Chan, BT; Heylen, Nancy; Fantini, Andrea; Houssa, Michel; Jurczak, Gosia; Goux, Ludovic (2013) -
A sensitivity map-based approach to profile defects in MIM capacitors from I-V, C-V and G-V measurements
Padovani, Andrea; Kaczer, Ben; Pesic, Milan; Belmonte, Attilio; Popovici, Mihaela Ioana; Nyns, Laura; Linten, Dimitri; Afanasiev, Valeri; Shlyakhov, Ilya; Lee, Younggon; Park, Hokyung; Larcher, Luca (2019) -
A thermally stable and high-performance 90nm Al2O3\Cu-based 1T1R CBRAM cell
Belmonte, Attilio; Kim, Woosik; Chan, BT; Heylen, Nancy; Fantini, Andrea; Houssa, Michel; Jurczak, Gosia; Goux, Ludovic (2013) -
Advanced a-VMCO resistive switching memory through inner interface engineering with wide (>10²) on/off window, tunable μA-range switching current and excellent variability
Govoreanu, Bogdan; Di Piazza, Luca; Ma, Jigang; Conard, Thierry; Vanleenhove, Anja; Belmonte, Attilio; Radisic, Dunja; Popovici, Mihaela Ioana; Velea, Alin; Redolfi, Augusto; Richard, Olivier; Clima, Sergiu; Adelmann, Christoph; Bender, Hugo; Jurczak, Gosia (2016) -
Analysis of the excellent memory disturb characteristics of a hourglass-shaped filament in Al2O3/Cu-based CBRAM devices
Belmonte, Attilio; Celano, Umberto; Redolfi, Augusto; Fantini, Andrea; Muller, Robert; Vandervorst, Wilfried; Houssa, Michel; Jurczak, Gosia; Goux, Ludovic (2015) -
Capacitor-less, Long-Retention (> 400s) DRAM Cell Paving the Way towards Low-Power and High-Density Monolithic 3D DRAM
Belmonte, Attilio; Oh, Hyungrock; Rassoul, Nouredine; Donadio, Gabriele Luca; Mitard, Jerome; Dekkers, Harold; Delhougne, Romain; Subhechha, Subhali; Vaisman Chasin, Adrian; van Setten, Michiel; Kljucar, Luka; Mao, Ming; Puliyalil, Harinarayanan; Pak, Murat; Teugels, Lieve; Tsvetanova, Diana; Banerjee, Kaustuv; Souriau, Laurent; Tokei, Zsolt; Goux, Ludovic; Kar, Gouri Sankar (2020) -
Causes and consequences of the stochastic aspect of filamentary RRAM
Degraeve, Robin; Fantini, Andrea; Raghavan, Nagarajan; Goux, Ludovic; Clima, Sergiu; Govoreanu, Bogdan; Belmonte, Attilio; Linten, Dimitri; Jurczak, Gosia (2015) -
Characterization of trap density in Indium-Gallium-Zinc-Oxide thin films by admittance measurements in multi-finger MOS structures
Tang, Hongwei; Belmonte, Attilio; Lin, Dennis; Afanasiev, Valeri; Verdonck, Patrick; Vaisman Chasin, Adrian; Dekkers, Harold; Delhougne, Romain; Van Houdt, Jan; Kar, Gouri Sankar (2024) -
Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy
Wu, Zhicheng; Vaisman Chasin, Adrian; Franco, Jacopo; Subhechha, Subhali; Dekkers, Harold; Yengula Venkata Ramana, Bhuvaneshwari; Belmonte, Attilio; Rassoul, Nouredine; van Setten, Michiel; Afanas'ev, V.; Delhougne, Romain; Kaczer, Ben; Kar, Gouri Sankar (2022) -
Co active electrode enhances CBRAM performance and scaling potential
Belmonte, Attilio; Radhakrishnan, Janaki; Donadio, Gabriele Luca; Redolfi, Augusto; Delhougne, Romain; Nyns, Laura; Covello, Angelo; Vereecke, Guy; Franquet, Alexis; Spampinato, Valentina; Kundu, Shreya; Mao, Ming; Goux, Ludovic; Kar, Gouri Sankar (2019) -
Complex amorphous oxides: property prediction from high throughput DFT and AI for new material search
van Setten, Michiel; Dekkers, Harold; Pashartis, Christopher; Vaisman Chasin, Adrian; Belmonte, Attilio; Delhougne, Romain; Kar, Gouri Sankar; Pourtois, Geoffrey (2022) -
Comprehensive Performance and Reliability Assessment of Se-based Selector-Only Memory
Ravsher, Taras; Degraeve, Robin; Garbin, Daniele; Clima, Sergiu; Fantini, Andrea; Donadio, Gabriele Luca; Kundu, Shreya; Devulder, Wouter; Hody, Hubert; Potoms, Goedele; Van Houdt, Jan; Afanasiev, Valeri; Belmonte, Attilio; Kar, Gouri Sankar (2024) -
Conductive filaments multiplicity as a variability factor in CBRAM
Celano, Umberto; Goux, Ludovic; Belmonte, Attilio; Opsomer, Karl; Detavernier, Christophe; Jurczak, Gosia; Vandervorst, Wilfried (2015) -
Conductive-AFM tomography for 3D filament observation in resistive switching devices
Celano, Umberto; Goux, Ludovic; Belmonte, Attilio; Schulze, Andreas; Opsomer, Karl; Detavernier, Christoph; Richard, Olivier; Bender, Hugo; Jurczak, Gosia; Vandervorst, Wilfried (2013) -
Demonstration of multilevel multiply accumulate operations for AiMC using engineered a-IGZO transistors-based 2T1C gain cell arrays
Subhechha, Subhali; Cosemans, Stefan; Belmonte, Attilio; Rassoul, Nouredine; Houshmand Sharifi, Shamin; Debacker, Peter; Verkest, Diederik; Delhougne, Romain; Kar, Gouri Sankar (2023) -
Deposition, Characterization, and Performance of Spinel InGaZnO4
Dekkers, Harold; van Setten, Michiel; Belmonte, Attilio; Vaisman Chasin, Adrian; Subhechha, Subhali; Rassoul, Nouredine; Glushkova, Anastasia; Delhougne, Romain; Kar, Gouri Sankar (2022-02-23) -
Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control
Subhechha, Subhali; Rassoul, Nouredine; Belmonte, Attilio; Hody, Hubert; Dekkers, Harold; van Setten, Michiel; Vaisman Chasin, Adrian; Houshmand Sharifi, Shamin; Banerjee, Kaustuv; Puliyalil, Harinarayanan; Kundu, Souvik; Pak, Murat; Tsvetanova, Diana; Bazzazian, Nina; Vandersmissen, Kevin; Batuk, Dmitry; Geypen, Jef; Heijlen, Jeroen; Delhougne, Romain; Kar, Gouri Sankar (2022) -
Device modeling of two-steps oxygen anneal-based submicron InGaZnO back-end-of-line field-effect transistor enabling short-channel effects suppression
Kim, Donguk; Kim, Je-Hyuk; Choi, Woo Sik; Yang, Tae Jun; Jang, Jun Tae; Belmonte, Attilio; Rassoul, Nouredine; Subhechha, Subhali; Delhougne, Romain; Kar, Gouri Sankar; Lee, Wonsok; Cho, Min Hee; Ha, Daewon; Kim, Dae Hwan (2022) -
Effect of the switching layer on CBRAM reliability and benchmarking against OxRAM devices
Reale, G.; Belmonte, Attilio; Fantini, Andrea; Radhakrishnan, Janaki; Redolfi, Augusto; Devulder, Wouter; Nyns, Laura; Kundu, Shreya; Delhougne, Romain; Goux, Ludovic; Kar, Gouri Sankar (2021)