Conductive-AFM tomography for 3D filament observation in resistive switching devices

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Authors
Celano, Umberto; Goux, Ludovic; Belmonte, Attilio; Schulze, Andreas; Opsomer, Karl; Detavernier, Christoph; Richard, Olivier; Bender, Hugo; Jurczak, Gosia; Vandervorst, Wilfried
Conference
International Electron Devices Meeting - IEDM
Title
Conductive-AFM tomography for 3D filament observation in resistive switching devices
Publication type
Proceedings paper
Embargo date
9999-12-31
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