Publication:

Conductive-AFM tomography for 3D filament observation in resistive switching devices

Date

2013

Proceedings Paper

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Files

27386.pdf 1.96 MB

Author(s)

Celano, Umberto

;

;

Belmonte, Attilio

;

Schulze, Andreas

;

;

Detavernier, Christoph

;

Richard, Olivier

;

;

;

Vandervorst, Wilfried

Metrics

1897 since deposited on 2021-10-21

Acq. date: 2025-12-14