Publication:

Conductive-AFM tomography for 3D filament observation in resistive switching devices

Date

2013
Proceedings Paper
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dc.contributor.authorCelano, Umberto
dc.contributor.authorGoux, Ludovic
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorSchulze, Andreas
dc.contributor.authorOpsomer, Karl
dc.contributor.authorDetavernier, Christoph
dc.contributor.authorRichard, Olivier
dc.contributor.authorBender, Hugo
dc.contributor.authorJurczak, Gosia
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.date.accessioned2021-10-21T06:54:03Z
dc.date.available2021-10-21T06:54:03Z
dc.date.embargo9999-12-31
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22113
dc.source.beginpage574
dc.source.conferenceInternational Electron Devices Meeting - IEDM
dc.source.conferencedate9/12/2013
dc.source.conferencelocationWashington, DC USA
dc.source.endpage577
dc.title

Conductive-AFM tomography for 3D filament observation in resistive switching devices

dc.typeProceedings paper
dspace.entity.typePublication
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