Browsing Articles by imec author "2b64802e549af3f9424755cb493a72cb256bf0d5"
Now showing items 1-5 of 5
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A consistent model for the hard breakdown distribution including digital soft breakdown: the noble art of area scaling
Roussel, Philippe; Degraeve, Robin; Sahhaf, Sahar; Groeseneken, Guido (2007) -
A new TDDB reliability prediction methodology accounting for multiple SBD and wear out
Sahhaf, Sahar; Degraeve, Robin; Roussel, Philippe; Kaczer, Ben; Kauerauf, Thomas; Groeseneken, Guido (2009) -
Correlation between the Vth-adjustment of nMOSFETs with HfSiO gate oxide and the energy profile of high-k bulk trap density
Sahhaf, Sahar; Degraeve, Robin; Srividya, Vidya; Kaczer, Ben; Gealy, Dan; Horiguchi, Naoto; Togo, Mitsuhiro; Hoffmann, Thomas Y.; Groeseneken, Guido (2010) -
Detailed analysis of charge pumping and IdVg hysteresis for profiling traps in SiO2/HfSiO(N)
Sahhaf, Sahar; Degraeve, Robin; Cho, Moon Ju; De Brabanter, K.; Roussel, Philippe; Zahid, Mohammed; Groeseneken, Guido (2010-12) -
HfSiO bulk trap density controls the initial Vth in nMOSFETs
Sahhaf, Sahar; Degraeve, Robin; Srividya, Vydia; De Brabanter, K.; Schram, Tom; Gilbert, Matthieu; Vandervorst, Wilfried; Groeseneken, Guido (2012-06)