Browsing Articles by imec author "40a3fc1ae934a190e34ba888e6dfea1ea3633994"
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A comprehensive model for the electrical nanocontact on germanium for scanning spreading resistance microscopy applications
Schulze, Andreas; Verhulst, Anne; Nazir, Aftab; Hantschel, Thomas; Eyben, Pierre; Vandervorst, Wilfried (2013) -
A low-power HKMG CMOS platform compatible with DRAM node 2x and beyond
Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Caillat, Christian; Aoulaiche, Marc; Cho, Moon Ju; Noh, Kyung Bong; Son, Yunik; Na, Hoon Jo; Kauerauf, Thomas; Douhard, Bastien; Nazir, Aftab; Chew, Soon Aik; Milenin, Alexey; Altamirano Sanchez, Efrain; Schoofs, Geert; Albert, Johan; Sebaai, Farid; Vecchio, Emma; Paraschiv, Vasile; Vandervorst, Wilfried; Lee, Sun Ghil; Collaert, Nadine; Fazan, Pierre; Horiguchi, Naoto; Thean, Aaron (2014) -
Accurate prediction of device performance based on 2-D carrier profiles in the presence of extensive mobile carrier diffusion
Nazir, Aftab; Spessot, Alessio; Eyben, Pierre; Clarysse, Trudo; Ritzenthaler, Romain; Schram, Tom; Vandervorst, Wilfried (2014) -
Fast Fourier transform scanning spreading resistance microscopy: a novel technique to overcome the limitations of classical conductive AFM techniques
Eyben, Pierre; Bisiaux, Pierre; Schulze, Andreas; Nazir, Aftab; Vandervorst, Wilfried (2015) -
Observation of diameter dependent carrier distribution in nanowire-based transistors
Schulze, Andreas; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne; Rooyackers, Rita; Vandooren, Anne; Mody, Jay; Nazir, Aftab; Leonelli, Daniele; Vandervorst, Wilfried (2011) -
Two-dimensional carrier mapping at the nanometerscale on 32nm node targeted p-MOSFETs using high vacuum scanning spreading resistance microscopy
Eyben, Pierre; Clarysse, Trudo; Mody, Jay; Nazir, Aftab; Schulze, Andreas; Hantschel, Thomas; Vandervorst, Wilfried (2012) -
Ultra shallow arsenic junctions in germanium formed by millisecond laser annealing
Hellings, Geert; Rosseel, Erik; Simoen, Eddy; Radisic, Dunja; Petersen, Dirch Hjorth; Hansen, Ole; Nielsen, Peter Folmer; Zschaetzsch, Gerd; Nazir, Aftab; Clarysse, Trudo; Vandervorst, Wilfried; Hoffmann, Thomas Y.; De Meyer, Kristin (2011) -
Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations
Nazir, Aftab; Eyben, Pierre; Clarysse, Trudo; Hellings, Geert; Schulze, Andreas; Mody, Jay; De Meyer, Kristin; Bender, Hugo; Vandervorst, Wilfried (2012)