Browsing Articles by imec author "f7850d45a94fd64545cbc8b6f858b8d20e3b5958"
Now showing items 1-15 of 15
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A Novel Ni-Al Alloy Metal Induced Lateral Crystallization Process for Improved Channel Conduction in 3-D NAND Flash
Ramesh, Siva; Banerjee, Kaustuv; Opsomer, Karl; Rachita, Iuliana; Bastos, Joao; Soulie, Jean-Philippe; Sebaai, Farid; Favia, Paola; Korytov, Maxim; Richard, Olivier; Breuil, Laurent; Arreghini, Antonio; Van den Bosch, Geert; Rosmeulen, Maarten (2022) -
Analysis of Wake-Up Reversal Behavior Induced by Imprint in La:HZO MFM Capacitors
Lee, Sumi; Ronchi, Nicolo; Bizindavyi, Jasper; Popovici, Mihaela Ioana; Banerjee, Kaustuv; Walke, Amey; Delhougne, Romain; Van Houdt, Jan; Shin, Changhwan (2023) -
Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory
Chang, Ting-Yu; Wang, Kuan-Chi; Liu, Hsien-Yang; Hseun, Jing-Hua; Peng, Wei-Cheng; Ronchi, Nicolo; Celano, Umberto; Banerjee, Kaustuv; Van Houdt, Jan; Wu, Tian-Li (2023) -
Defect profiling in FEFET Si:HfO2 layers
O'Sullivan, Barry; Putcha, Vamsi; Izmailov, Roman; Afanas'ev, Valeri V.; Simoen, Eddy; Jung, Taehwan; Higashi, Yusuke; Degraeve, Robin; Truijen, Brecht; Kaczer, Ben; Ronchi, Nicolo; McMitchell, Sean; Banerjee, Kaustuv; Clima, Sergiu; Breuil, Laurent; Van den Bosch, Geert; Linten, Dimitri; Van Houdt, Jan (2020) -
Electrical Investigation of Wake-Up in High Endurance Fatigue-Free La and Y Doped HZO Meal-Ferroelectric-Metal Capacitors
Walke, Amey; Popovici, Mihaela Ioana; Banerjee, Kaustuv; Clima, Sergiu; Kumbhare, Pankaj; Desmet, Johan; Meersschaut, Johan; Van den Bosch, Geert; Delhougne, Romain; Kar, Gouri Sankar; Van Houdt, Jan (2022-07-12) -
Elucidating possible crystallographic origins of wake-up mechanisms in ferroelectric hafnia
McMitchell, Sean; Clima, Sergiu; Ronchi, Nicolo; Banerjee, Kaustuv; Celano, Umberto; Popovici, Mihaela Ioana; Di Piazza, Luca; Van den Bosch, Geert; Van Houdt, Jan (2021) -
Engineering Strain and Texture in Ferroelectric Scandium-Doped Aluminium Nitride
McMitchell, Sean; Walke, Amey; Banerjee, Kaustuv; Mertens, Sofie; Piao, Xiaoyu; Mao, Ming; Katcko, Kostantine; Vellianitis, Georgios; Van Dal, Mark; Lin, Yu-Ming; Van den Bosch, Geert; Delhougne, Romain; Kar, Gouri Sankar (2023) -
Ferroelectric La-Doped ZrO2/HfxZr1-xO2 Bilayer Stacks with Enhanced Endurance
Popovici, Mihaela Ioana; Walke, Amey; Banerjee, Kaustuv; Ronchi, Nicolo; Meersschaut, Johan; Celano, Umberto; McMitchell, Sean; Spampinato, Valentina; Franquet, Alexis; Favia, Paola; Swerts, Johan; Van den Bosch, Geert; Van Houdt, Jan (2021) -
High-Endurance Ferroelectric (La, Y) and (La, Gd) Co-Doped Hafnium Zirconate Grown by Atomic Layer Deposition
Popovici, Mihaela Ioana; Walke, Amey; Bizindavyi, Jasper; Meersschaut, Johan; Banerjee, Kaustuv; Potoms, Goedele; Katcko, Kostantine; Van den Bosch, Geert; Delhougne, Romain; Kar, Gouri Sankar; Van Houdt, Jan (2022) -
Impact of Charge Trapping and Depolarization on Data Retention Using Simultaneous P-V and I-V in HfO2-Based Ferroelectric FET
Higashi, Yusuke; Ronchi, Nicolo; Kaczer, Ben; Alam, Md Nur Kutubul; O'Sullivan, Barry; Banerjee, Kaustuv; McMitchell, Sean; Breuil, Laurent; Walke, Amey; Van den Bosch, Geert; Linten, Dimitri; Van Houdt, Jan (2021) -
Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal-Ferroelectric-Insulator-Semiconductor Capacitors
Wu, Cheng-Hung; Ronchi, Nicolo; Wang, Kuan-Chi; Wang, Yu-Yun; Mcmitchell, Sean; Banerjee, Kaustuv; van den Bosch, Geert; van Houdt, Jan; Wu, Tian-Li (2022) -
Investigation of imprint in FE-HfO2 and its recovery
Higashi, Yusuke; Kaczer, Ben; Verhulst, Anne; O'Sullivan, Barry; Ronchi, Nicolo; McMitchell, Sean; Banerjee, Kaustuv; Di Piazza, Luca; Suzuki, Masamichi; Linten, Dimitri; Van Houdt, Jan (2020) -
Program/Erase Scheme for Suppressing Interface Trap Generation in HfO2-Based Ferroelectric Field Effect Transistor
Min, Jinhong; Ronchi, Nicolo; O'Sullivan, Barry; Banerjee, Kaustuv; Van den Bosch, Geert; Van Houdt, Jan; Shin, Changhwan; McMitchell, Sean (2021) -
Relaxation analysis to understand positive bias induced trapping in ferroelectric FETs with Si and Gd dopants
Wang, Yu-Yun; Wang, Kuan-Chi; Chang, Ting -Yu; Ronchi, Nicolo; O'Sullivan, Barry; Banerjee, Kaustuv; Van den Bosch, Geert; Van Houdt, Jan; Wu, Tian-Li (2022) -
Variability in Planar FeFETs-Channel Percolation Impact
Kaczmarek, Jakub; Garcia Bardon, Marie; Xiang, Yang; Ronchi, Nicolo; Ragnarsson, Lars-Ake; Celano, Umberto; Banerjee, Kaustuv; Kaczer, Ben; Groeseneken, Guido; Van Houdt, Jan (2023)