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Energy barriers between (100)Si and Al2O3 and ZrO2-based dielectric stacks: internal electron photoemission measurements
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Energy barriers between (100)Si and Al2O3 and ZrO2-based dielectric stacks: internal electron photoemission measurements
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Date
2001
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Afanas'ev, V. V.
;
Houssa, Michel
;
Stesmans, Andre
;
Adriaenssens, G. J.
;
Heyns, Marc
Journal
Microelectronic Engineering
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1922
since deposited on 2021-10-14
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Acq. date: 2026-01-12
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Metrics
Views
1922
since deposited on 2021-10-14
2
last month
Acq. date: 2026-01-12
Citations