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Analytical electron microscopy of Si1-xGex/Si heterostructures and local isolation structures
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Analytical electron microscopy of Si1-xGex/Si heterostructures and local isolation structures
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Date
1995
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Armigliato, A.
;
Balboni, R.
;
Corticelli, F.
;
Malvezzi, F.
;
Vanhellemont, Jan
Journal
Materials Science and Technology
Abstract
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1997
since deposited on 2021-09-29
1
last month
Acq. date: 2026-01-04
Citations
Metrics
Views
1997
since deposited on 2021-09-29
1
last month
Acq. date: 2026-01-04
Citations