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Conference contributions
Carrier spilling revisited: the on-bevel junction behavior of different electrical depth profiling techniques
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Carrier spilling revisited: the on-bevel junction behavior of different electrical depth profiling techniques
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Date
2001
Meeting abstract
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5143.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Clarysse, Trudo
;
Eyben, Pierre
;
Duhayon, Natasja
;
Xu, Mingwei
;
Vandervorst, Wilfried
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Abstract
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2012
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-11
Citations
Metrics
Views
2012
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-11
Citations