Study of the hot-carrier degradation performance of 0.35 μm fully overlapped LDD devices

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Authors
Bellens, Rudi; Habas, Predrag; Groeseneken, Guido; Maes, Herman; Mieville, Jean-Paul; Van den bosch, G.
Journal
Microelectronic Engineering
Volume
28
Title
Study of the hot-carrier degradation performance of 0.35 μm fully overlapped LDD devices
Publication type
Journal article
Embargo date
9999-12-31
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