A simple characterization method for MOS transistor matching in deep submicron technologies

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Authors
Croon, Jeroen; Rosmeulen, Maarten; Decoutere, Stefaan; Sansen, Willy; Maes, Herman
Conference
Proceedings IEEE 2001 International Conference on Microelectronic Test Structures;
Title
A simple characterization method for MOS transistor matching in deep submicron technologies
Publication type
Proceedings paper
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