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A simple characterization method for MOS transistor matching in deep submicron technologies

dc.contributor.authorCroon, Jeroen
dc.contributor.authorRosmeulen, Maarten
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorSansen, Willy
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-10-14T16:44:03Z
dc.date.available2021-10-14T16:44:03Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5172
dc.sourceIIOimport
dc.titleA simple characterization method for MOS transistor matching in deep submicron technologies
dc.typeProceedings paper
dc.contributor.imecauthorRosmeulen, Maarten
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecRosmeulen, Maarten::0000-0002-3663-7439
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewno
dc.source.beginpage213
dc.source.endpage218
dc.source.conferenceProceedings IEEE 2001 International Conference on Microelectronic Test Structures;
dc.source.conferencelocation
imec.availabilityPublished - imec


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