Authors

Bellens, Rudi; Habas, Predrag; Groeseneken, Guido; Maes, Herman; Mieville, Jean-Paul; Van den bosch, G.; Deferm, Ludo

Conference

33rd Annual IEEE International Reliability Physics Conference - IRPS

Title

Analysis and optimisation of the hot-carrier degradation performance of 0.35μm fully overlapped LDD devices

Publication type

Proceedings paper

Embargo date

9999-12-31