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Analysis and optimisation of the hot-carrier degradation performance of 0.35μm fully overlapped LDD devices

dc.contributor.authorBellens, Rudi
dc.contributor.authorHabas, Predrag
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.contributor.authorMieville, Jean-Paul
dc.contributor.authorVan den bosch, G.
dc.contributor.authorDeferm, Ludo
dc.date.accessioned2021-09-29T13:04:13Z
dc.date.available2021-09-29T13:04:13Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/518
dc.sourceIIOimport
dc.titleAnalysis and optimisation of the hot-carrier degradation performance of 0.35μm fully overlapped LDD devices
dc.typeProceedings paper
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDeferm, Ludo
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage254
dc.source.endpage259
dc.source.conference33rd Annual IEEE International Reliability Physics Conference - IRPS
dc.source.conferencedate4/05/1995
dc.source.conferencelocationLas Vegas, NV USA
imec.availabilityPublished - open access


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