Authors

Grazzi, C.; Albrecht, M.; Strunk, H. P.; Bougrioua, Zahia; Moerman, Ingrid

Conference

GADEST 2001 - Proceedings of the 9th International Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology;

Title

Minority carrier diffusion lengths in silicon doped gallium nitride thin films measured by electron beam induced current

Publication type

Proceedings paper