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Impact of oxide breakdown on FET and circuit operation and reliability

dc.contributor.authorKaczer, Ben
dc.contributor.authorDegraeve, Robin
dc.contributor.authorDe Keersgieter, An
dc.contributor.authorVan de Mieroop, Koen
dc.contributor.authorRasras, Mahmoud
dc.contributor.authorSimons, Veerle
dc.contributor.authorRoussel, Philippe
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-14T17:08:01Z
dc.date.available2021-10-14T17:08:01Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5388
dc.sourceIIOimport
dc.titleImpact of oxide breakdown on FET and circuit operation and reliability
dc.typeOral presentation
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorDe Keersgieter, An
dc.contributor.imecauthorSimons, Veerle
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecDe Keersgieter, An::0000-0002-5527-8582
dc.contributor.orcidimecSimons, Veerle::0000-0001-5714-955X
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.source.peerreviewno
dc.source.conferenceSISC-Conference; December 2001; Washington, D.C.
dc.source.conferencelocation
imec.availabilityPublished - imec


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