A novel hot-hole injection degradation model for lateral nDMOS transistors

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Authors
Moens, P.; Tack, Marnix; Degraeve, Robin; Groeseneken, Guido
Conference
IEDM Technical Digest; December 2001; Washington, D.C.
Title
A novel hot-hole injection degradation model for lateral nDMOS transistors
Publication type
Proceedings paper
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