Publication:

A novel hot-hole injection degradation model for lateral nDMOS transistors

Date

2001

Proceedings Paper

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Author(s)

Moens, P.

;

Tack, Marnix

;

Degraeve, Robin

;

Groeseneken, Guido

Statistics

1951 since deposited on 2021-10-14

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Acq. date: 2026-09-19