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Extraction of the oxide charge density at front and back interfaces of SOI NMOSFET devices
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Extraction of the oxide charge density at front and back interfaces of SOI NMOSFET devices
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Date
2001
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nicolett, A. S.
;
Martino, Joao Antonio
;
Simoen, Eddy
;
Claeys, Cor
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Views
2047
since deposited on 2021-10-14
4
last month
1
last week
Acq. date: 2026-01-26
Citations