Authors

Ohyama, Hidenori; Nakabayashi, M.; Simoen, Eddy; Claeys, C.; Tanaka, T.; Hirao, T.; Onada, S.; Kobayashi, K.

Conference

Proceedings of the 12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF;

Title

Radiation damages of polycrystalline silicon films and NPN Si transistors by high-energy particle irradiation

Publication type

Oral presentation