Publication:
Electron spin resonance observation of Si dangling bond type defects at the interface (100)Si and ultrathin stacks of SiO2, Al2O3, and ZrO2
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1921 since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1921 since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations