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Dimensioning of open-ended coaxial probes for the dielectric characterization of thin-layered materials

dc.contributor.authorStevens, Nobby
dc.contributor.authorMartens, Luc
dc.date.accessioned2021-10-14T17:53:35Z
dc.date.available2021-10-14T17:53:35Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5677
dc.sourceIIOimport
dc.titleDimensioning of open-ended coaxial probes for the dielectric characterization of thin-layered materials
dc.typeProceedings paper
dc.contributor.imecauthorMartens, Luc
dc.contributor.orcidimecMartens, Luc::0000-0001-9948-9157
dc.source.peerreviewno
dc.source.beginpage1288
dc.source.endpage1290
dc.source.conferenceIEEE Instrumentation and Measurement Technology Conference
dc.source.conferencedate21/05/2001
dc.source.conferencelocationBudapest Hungary
imec.availabilityPublished - imec


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