Authors

Criel, Steven; Haelvoet, Kurt; Martens, Luc; De Zutter, Daniel; Franchois, Ann; De Smedt, R.; De Langhe, Pascal

Conference

Atlanta 1995.EMC - a Global Concern. IEEE 1995 International Symposium on Electromagnetic Compatibility. Symposium Record; Augus

Title

Theoretical and experimental quantitative characterization of the near-fields of printed circuit board interconnection structures

Publication type

Proceedings paper