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Comparison of Bosch and cryogenic processes for patterning high aspect ration features in silicon
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Authors
Walker, M. J.
;
de Boer, M. J.
;
Jansen, Henri
Conference
MEMS Design, Fabrication, Characterization and Packaging; 1 June 2001; Edinburgh, Scotland.
Title
Comparison of Bosch and cryogenic processes for patterning high aspect ration features in silicon
Publication type
Proceedings paper
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