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Behaviour of Poly-Si1-XGex-gated MOS capacitors under different electrical stress conditions in the direct tunnelling regime
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Authors
Yousif, M. Y. A.
;
Willander, M.
;
Lundgren, P.
;
Caymax, Matty
Issue
6
Journal
Semiconductor Science and Technology
Volume
16
Title
Behaviour of Poly-Si1-XGex-gated MOS capacitors under different electrical stress conditions in the direct tunnelling regime
Publication type
Journal article
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