Publication:

Unified Analysis of Time-Dependent Dielectric Breakdown to Extend Reliability Margins

Date

2025-10-06

Journal article

https://doi.org/10.1109/ted.2025.3613295

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Author(s)

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Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Statistics

3 since deposited on 2026-05-11

Acq. date: 2026-05-17