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Chiplet Interconnect Repair for Clustered Defects with Minimal Propagation Delay
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Chiplet Interconnect Repair for Clustered Defects with Minimal Propagation Delay
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Date
2025
Proceedings Paper
https://doi.org/10.1109/ats66998.2025.00021
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chuang, Po-Yao
;
Marinissen, Erik Jan
Journal
2025 IEEE 34th Asian Test Symposium (ATS)
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