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Non-destructive characterisation of porous low-k dielectric films
Publication:
Non-destructive characterisation of porous low-k dielectric films
Date
2002
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Baklanov, Mikhaïl
;
Moguilnikov, Konstantin
Journal
Microelectronic Engineering
Abstract
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1960
since deposited on 2021-10-14
Acq. date: 2025-10-28
Citations
Metrics
Views
1960
since deposited on 2021-10-14
Acq. date: 2025-10-28
Citations