Browsing Presentations by imec author "40a3fc1ae934a190e34ba888e6dfea1ea3633994"
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Combining UHV AFM and SEM for high resolution, repeatable and low noise scanning spreading resistance microscopy
Eyben, Pierre; Chintala, Ravi Chandra; Mannarino, Manuel; Nazir, Aftab; Schulze, Andreas; Vandervorst, Wilfried (2013) -
Damage-free contact mode current sensing SPM: benchmarking PFTUNA vs. C-AFM
Celano, Umberto; Chintala, Ravi Chandra; Hoflijk, Ilse; Moussa, Alain; Vanhaeren, Danielle; Mannarino, Manuel; Nazir, Aftab; Eyben, Pierre; Vandervorst, Wilfried (2013) -
Development and optimization of FIB-based sample preparation for SSRM
Eyben, Pierre; Mody, Jay; Nazir, Aftab; Schulze, Andreas; Hantschel, Thomas; Vandervorst, Wilfried (2010) -
Development of a dedicated software for the quantification of two-dimensional high vacuum scanning spreading resistance microscopy measurements
Eyben, Pierre; Clarysse, Trudo; Schulze, Andreas; Nazir, Aftab; Vandervorst, Wilfried (2012) -
Incorporation of 2D-carrier profiles from HV-SSRM into device simulator
Nazir, Aftab; Eyben, Pierre; Clarysse, Trudo; Schulze, Andreas; Vandervorst, Wilfried (2011)