Browsing Presentations by imec author "42a548c9f15c160767d6f83006cf635cea6ff376"
Now showing items 1-9 of 9
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ALD strontium titanates and their characterization
Popovici, Mihaela Ioana; Van Elshocht, Sven; Tomida, Kazuyuki; Menou, Nicolas; Swerts, Johan; Pawlak, Malgorzata; Kaczer, Ben; Kim, Min-Soo; Brijs, Bert; Favia, Paola; Conard, Thierry; Franquet, Alexis; Moussa, Alain; Debusschere, Ingrid; Altimime, Laith; Kittl, Jorge (2010) -
Anisotropic biaxial stress measurements in finFET channels through nano-focused raman spectroscopy
Nuytten, Thomas; Jamal, Muhammad Tahir; Hantschel, Thomas; Bogdanowicz, Janusz; Schulze, Andreas; Favia, Paola; Bender, Hugo; De Wolf, Ingrid; Vandervorst, Wilfried (2016) -
High quality GaN based structures grown on large size Si(111) substrates using interlayers by MOVPE
Cheng, Kai; Leys, Maarten; Degroote, Stefan; Derluyn, Joff; Sijmus, Bram; Favia, Paola; Bender, Hugo; Germain, Marianne; Borghs, Gustaaf (2007) -
Interfacial reactions and phase stabilization of doped hafnia and higher-k oxides: the added value of GATR-FTIR
Hardy, An; Adelmann, Christoph; Van Elshocht, Sven; Favia, Paola; Bender, Hugo; Franquet, Alexis; Van den Rul, Heidi; Van Bael, Marlies; D'Haen, Jan; De Gendt, Stefan; D'Olieslaeger, Marc; Heyns, Marc; Kittl, Jorge; Detavernier, Christophe; Mullens, Jules (2009) -
Nano-beam diffraction investigation of the strain evolution in SiGe channel pFETs with gate first or gate last process
Favia, Paola; Eneman, Geert; Yamaguchi, Shinpei; Witters, Liesbeth; Bender, Hugo (2012) -
Plan-view specimen preparation of device structures with FIB
Bender, Hugo; Van Marcke, Patricia; Richard, Olivier; Favia, Paola (2015) -
Structural analysis of TSVs
Bender, Hugo; Drijbooms, Chris; Van Marcke, Patricia; Geypen, Jef; Richard, Olivier; Favia, Paola (2010) -
Structural and low-loss characterization of synthetic 2D-TMDs
Nalin Mehta, Ankit; Groven, Benjamin; Chiappe, Daniele; Favia, Paola; Bender, Hugo; Delabie, Annelies; Caymax, Matty; Vandervorst, Wilfried (2018) -
X-ray absorption correction in pillar shaped samples
Bender, Hugo; Seidel, Felix; Favia, Paola; Richard, Olivier (2017)