Browsing Presentations by author "Ablett, James"
Now showing items 1-2 of 2
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Characterization of CVD-Mn barrier layers using X-ray absorption fine structure
Ablett, James; Wilson, Chris; Phuong, Nguyen Mai; Koike, Junichi; Tokei, Zsolt; Sterbinsky, George; Woicik, Joseph (2011) -
Interpretation of Cu/SOG stress induced voiding using stress measurements performed with synchrotron radiation
Wilson, Chris; Croes, Kristof; Ablett, James; Lofrano, Melina; Beyer, Gerald; Tokei, Zsolt (2011)