Browsing Presentations by imec author "823a379c6cab91e5056929f33191723c3b43ad66"
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3D dopant profiling in silicon nanowires
Fleischmann, Claudia; Melkonyan, Davit; Arnoldi, Laurent; Bogdanowicz, Janusz; Kumar, Arul; Veloso, Anabela; Vandervorst, Wilfried (2016) -
Accurate stoichiometric analysis of Al1 xGaxN/GaN structures using APT and the influence of laser, poles and zone lines
Morris, Richard; Arnoldi, Laurent; Cuduvally, Ramya; Melkonyan, Davit; Fleischmann, Claudia; Zhao, Ming; Vandervorst, Wilfried (2017) -
Actual 3D analysis of hybrid arrays with in-situ SPM in a combined TOF-SIMS/SPM tool
Spampinato, Valentina; Dialameh, Masoud; Fleischmann, Claudia; Franquet, Alexis; Vandervorst, Wilfried; van der Heide, Paul (2018) -
APT analysis of short (~200 nm) Si nanowires embedded in SiO2 and HfO2
Melkonyan, Davit; Fleischmann, Claudia; Veloso, Anabela; Arnoldi, Laurent; Kumar, Arul; Bogdanowicz, Janusz; Vurpillot, Francois; Vandervorst, Wilfried (2016) -
Atom probe conditions for stoichiometric quantification of GaN and Al1 xGaxN
Morris, Richard; Arnoldi, Laurent; Cuduvally, Ramya; Melkonyan, Davit; Fleischmann, Claudia; Zhao, Ming; Vandervorst, Wilfried (2017) -
Atom probe tomography on contemporary semiconductor devices: Challenges in data acquisition, quantification and spatial accuracy
Scheerder, Jeroen; Fleischmann, Claudia; Dialameh, Masoud; Melkonyan, Davit; Morris, Richard; Vandervorst, Wilfried; van der Heide, Paul (2019) -
Development and reference-free characterization of 3D nanostructures as potential calibration sample for analytical techniques
Dialameh, Masoud; Ferrarese Lupi, Federico; De Leo, Natascia; Boarino, Luca; Hönicke, Philipp; Kayser, Yves; Beckhoff, Burkhard; Weimann, Thomas; Fleischmann, Claudia; Vandervorst, Wilfried (2017) -
Fundamental aspects of germanium surface passivation by gas phase oxidation and liquid phase sulfidation
Fleischmann, Claudia; Schouteden, Koen; Houssa, Michel; Sioncke, Sonja; Mueller, Matthias; Van Haesendonck, Chris; Temst, Kristiaan; Vantomme, Andre (2014) -
Post-Ionization of Silicon Clusters in Atom Probe Microscopy: A Joint Theoretical and Experimental Investigation.
Cuduvally, Ramya; Oosterbos, Giel; Morris, Richard; Fleischmann, Claudia; Ferrari, Piero; Scheerder, Jeroen; Vantomme, Andre; Vandervorst, Wilfried (2019) -
Potential sources of inaccuracy for the composition quantification of InGaAs and InAlAs
Cuduvally, Ramya; Morris, Richard; Melkonyan, Davit; Arnoldi, Laurent; Bogdanowicz, Janusz; Fleischmann, Claudia; Vandervorst, Wilfried (2017) -
Soft x-ray spectroscopy reveals chemical information beneath the surface of organic photovoltaic devices
Fleischmann, Claudia; Hoenicke, Philipp; Mueller, Matthias; Beckhoff, Burkhard; Voroshazi, Eszter; Tait, Jeffrey; Conard, Thierry; Vandervorst, Wilfried (2014) -
Thermally induced pit formation and Sn diffusion in strained GeSn films
Fleischmann, Claudia; Lieten, Ruben; Hoenicke, Philipp; Seidel, Felix; Zaima, Shimura; Conard, Thierry; Temst, Kristiaan; Vandervorst, Wilfried; Vantomme, Andre (2014)