Publication:
APT analysis of short (~200 nm) Si nanowires embedded in SiO2 and HfO2
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1997 since deposited on 2021-10-23
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Acq. date: 2026-02-25
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1997 since deposited on 2021-10-23
2last month
1last week
Acq. date: 2026-02-25
Citations