Publication:

APT analysis of short (~200 nm) Si nanowires embedded in SiO2 and HfO2

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1995 since deposited on 2021-10-23
6last month
Acq. date: 2026-01-25

Citations

Statistics

Views

1995 since deposited on 2021-10-23
6last month
Acq. date: 2026-01-25

Citations