Browsing Presentations by imec author "b2d58ce7bd37aa8d6398218af9a9f2fc59b205e7"
Now showing items 21-39 of 39
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Nanometer scale characterization of ULSI devices using scanning probes
Vandervorst, Wilfried; Eyben, Pierre; Clarysse, Trudo; Duhayon, Natasja; Xu, Mingwei; Hantschel, Thomas (2000) -
Nanoprober as a tool for electrical measurements of nanostructures
Olanterae, Lauri; Arstila, Kai; Hantschel, Thomas; Palanne, Saku; Sajavaara, Timo (2010) -
Nanoprober based EBIC measurements for nanowire transistor structures
Arstila, Kai; Hantschel, Thomas; Schulze, Andreas; Vandooren, Anne; Verhulst, Anne; Eyben, Pierre; Vandervorst, Wilfried (2011) -
Nanoscopic controlled material removal using diamond tips
Hantschel, Thomas; Schulze, Andreas; Tsigkourakos, Menelaos; Arstila, Kai; Moussa, Alain; Eyben, Pierre; Vandervorst, Wilfried (2012) -
Probing electrical properties of semiconductor structures on the nm-scale
Vandervorst, Wilfried; Meuris, Marc; De Wolf, P.; Alvarez, D.; Hantschel, Thomas; Trenkler, T.; Fouchier, M.; Duhayon, Natasja; Polspoel, Wouter; Mody, Jay (2008) -
Progress towards quantitative high spatial resolution 1D and 2D carrier profiling using scanning probe techniques
Duhayon, Natasja; Eyben, Pierre; Hantschel, Thomas; Xu, Mingwei; Clarysse, Trudo; Vandervorst, Wilfried (2000) -
S-shaped double-spring structures for high stiffness and spring height
Hantschel, Thomas; Chow, Eugene (2011) -
Scanning probe microscopy of 1-D and 2-D carrier distributions
Stephenson, Robert; De Wolf, Peter; Trenkler, Thomas; Hantschel, Thomas; Clarysse, Trudo; Vandervorst, Wilfried (1998) -
Scanning spreading resistance microscopy for electrical characterization of diamond interfacial layers
Xu, Blair; Hantschel, Thomas; Tsigkourakos, Menelaos; Vandervorst, Wilfried (2015) -
Spin-seeding approach for diamond growth on silicon-wafer substrates
Tsigkourakos, Menelaos; Hantschel, Thomas; Janssens, Stoffel D.; Haenen, Ken; Arstila, Kai; Vandervorst, Wilfried (2012) -
TEM analysis and electrical probing on thin TEM lamellas of CBRAM stacks
Seidel, Felix; Richard, Olivier; Bender, Hugo; Hantschel, Thomas; Goux, Ludovic; Jurczak, Gosia; Vandervorst, Wilfried (2014) -
The effect of O presence on the early growth phases of B-doped diamond
Tsigkourakos, Menelaos; Hantschel, Thomas; Nuytten, Thomas; Verhulst, Anne; Xu, Blair; Douhard, Bastien; Vandervorst, Wilfried (2015) -
Three-dimensional electrical characterization of carbon nanotube-based interconnects at the nanometer-scale
Schulze, Andreas; Hantschel, Thomas; Date, Lucien; Chiodarelli, Nicolo; Eyben, Pierre; Vandervorst, Wilfried (2011) -
TiN scanning probes for electrical profiling of nanoelectronics device structures
Hantschel, Thomas; Schulze, Andreas; Celano, Umberto; Moussa, Alain; Arstila, Kai; Eyben, Pierre; Majeed, Bivragh; Sabuncuoglu Tezcan, Deniz; Werner, Thilo; Vandervorst, Wilfried (2011) -
Tip-on-tip: a novel AFM tip configuration for the electrical characterization of semiconductor devices
Hantschel, Thomas; Trenkler, Thomas; Vandervorst, Wilfried; Malave, A.; Kulisch, W.; Oesterschulze, E.; Buechel, D. (1998) -
Towards routine, quantitative two-dimensional carrier profiling with Scanning Spreading Resistance Microscopy
Vandervorst, Wilfried; Eyben, Pierre; Callewaert, Sven; Hantschel, Thomas; Duhayon, Natasja; Xu, Mingwei; Trenkler, Thomas; Clarysse, Trudo (2000) -
Transient behaviour in colloidal nanodiamond seeding
Hantschel, Thomas; Calzolaro, Anthony; Boehme, Thijs; Vereecken, Philippe; Vandervorst, Wilfried (2017) -
Tribological properties of conductive bron doped nanocrystalline diamond films
Podgursky, Vitali; Hantschel, Thomas; Bogatov, A.; Kimmari, E.; Antonov, M.; Tsigkourakos, Menelaos; Vandervorst, Wilfried; Buijnsters, J.G.; Raadik, A.T. (2012) -
Two-dimensional profiling using scanning spreading resistance microscopy
De Wolf, Peter; Vandervorst, Wilfried; Clarysse, Trudo; Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert (1999)