Recently added

van Grinsven, B.; Vanden Bon, N.; Strauven, H.; Grieten, L.; Murib, M.; Janssens, S.D.; Haenen, Ken; Schöning, M.J.; Vermeeren, V.; Ameloot, M.; Michiels, L.; Thoelen, R.; De Ceuninck, Ward; Wagner, Patrick (2012)

Deposition of barrier materials for interconnects

Van Elshocht, Sven (2012)

Improving refractive index sensing by tailoring the lineshape and measuring the phase of plasmonic resonances

Van Dorpe, Pol; Verellen, Niels; Lodewijks, Kristof; Ye, Jian; Lagae, Liesbet (2012)

New non-volatile memory solutions: how they may (not) serve future systems

Van der Perre, Liesbet (2012)

Plenary session: Enhancing Innovation: Dialogue among political leaders, scientists and industrialists

Van den hove, Luc (2012)

Leading-edge technology vital for future competitiveness

Van den hove, Luc (2012)

Study of multilayer defects on sub-32nm HP EUV reticles

Van Den Heuvel, Dieter; Jonckheere, Rik; Bret, Tristan; Waiblinger, Markus (2012)

Strategic Initiative Materials (SIM): Joint materials research between Flemish research insitutes and industry

Van Bael, Marlies; Hardy, An (2012)

Solution based deposition of nanostructured oxides: strategies to address current challenges

Van Bael, Marlies; Hardy, An (2012)

Presentations: Recent submissions

Interposer technology for high-speed, high-density interconnects ﻿

In-line wafer-level monitoring of the strain gradient in MEMS structural layers using an optical interferometer ﻿

USJ metrology : from 0D to 3D analysis ﻿

Atomprobe tomography : meeting the metrology challenges of the next generation semiconductor technologies? ﻿

Probing dopant, carrier and impurity distributions in small 3D-structures and confined volumes with SIMS, Atomprobe Tomography, SSRM and C-AFM ﻿

SIMS for semiconductor applications : meeting the resolution challenges ﻿

Probing 3D-semiconductors structures ﻿

Dopant profiling in semiconductors with SIMS ﻿

Finding the right mix of parallelism in a coarse-grained array baseband processor ﻿

Modeling of tunnel field-effect transistors ﻿

Development of a diamond-based, electronic sensor platform for rapid and reliable medical diagnostics ﻿

Heat-transfer resistance at solid-liquid interfaces: a tool for the detection of single nucleotide plymorphisms in DNA ﻿

Deposition of barrier materials for interconnects ﻿

Improving refractive index sensing by tailoring the lineshape and measuring the phase of plasmonic resonances ﻿

New non-volatile memory solutions: how they may (not) serve future systems ﻿

Plenary session: Enhancing Innovation: Dialogue among political leaders, scientists and industrialists ﻿

Leading-edge technology vital for future competitiveness ﻿

Study of multilayer defects on sub-32nm HP EUV reticles ﻿

Strategic Initiative Materials (SIM): Joint materials research between Flemish research insitutes and industry ﻿

Solution based deposition of nanostructured oxides: strategies to address current challenges ﻿

Interposer technology for high-speed, high-density interconnects

In-line wafer-level monitoring of the strain gradient in MEMS structural layers using an optical interferometer

USJ metrology : from 0D to 3D analysis

Atomprobe tomography : meeting the metrology challenges of the next generation semiconductor technologies?

Probing dopant, carrier and impurity distributions in small 3D-structures and confined volumes with SIMS, Atomprobe Tomography, SSRM and C-AFM

SIMS for semiconductor applications : meeting the resolution challenges

Probing 3D-semiconductors structures

Dopant profiling in semiconductors with SIMS

Finding the right mix of parallelism in a coarse-grained array baseband processor

Modeling of tunnel field-effect transistors

Development of a diamond-based, electronic sensor platform for rapid and reliable medical diagnostics

Heat-transfer resistance at solid-liquid interfaces: a tool for the detection of single nucleotide plymorphisms in DNA