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Articles
Oxide and interface degradation and breakdown under medium and high field injection conditions: a correlation study
Publication:
Oxide and interface degradation and breakdown under medium and high field injection conditions: a correlation study
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Date
1995
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Groeseneken, Guido
;
De Wolf, Ingrid
;
Maes, Herman
Journal
Microelectronic Engineering
Abstract
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1981
since deposited on 2021-09-29
3
last month
1
last week
Acq. date: 2025-12-16
Citations
Metrics
Views
1981
since deposited on 2021-09-29
3
last month
1
last week
Acq. date: 2025-12-16
Citations