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Oxide and interface degradation and breakdown under medium and high field injection conditions: a correlation study
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Authors
Degraeve, Robin
;
Groeseneken, Guido
;
De Wolf, Ingrid
;
Maes, Herman
Issue
1_4
Journal
Microelectronic Engineering
Volume
28
Title
Oxide and interface degradation and breakdown under medium and high field injection conditions: a correlation study
Publication type
Journal article
Embargo date
9999-12-31
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