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Conference contributions
Breakdown and instability of 3 nm Gate Oxide
Publication:
Breakdown and instability of 3 nm Gate Oxide
Date
1995
Meeting abstract
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594.pdf
93.45 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Depas, Michel
;
Vermeire, Bert
;
Heyns, Marc
Journal
Abstract
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2060
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
2060
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations